Spectroscopic Thickness Gauge "AccureS"
Achieving high-precision measurement of thin films using spectral interference methods! Capable of multi-layer measurement up to three layers.
"AccureS" is a thickness measuring device based on spectral interference methods. The measurement section traverses in the width direction, measuring and displaying data at 1mm intervals. Two analysis methods can be used: curve fitting and FFT (Fast Fourier Transform), allowing you to choose the most suitable method for the material. Due to the one-axis drive that integrates the irradiation and detection sections, the measurement section is small and compact. 【Features】 ■ Measures and displays data at 1mm intervals ■ Two analysis methods available: curve fitting and FFT (Fast Fourier Transform) ■ Does not use radiation, so no administrator or management qualifications are required ■ Can register up to 1000 measurement conditions ■ Capable of displaying graphs suited to the purpose *For more details, please refer to the PDF document or feel free to contact us.
- Company：ヒューテック
- Price：Other
